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Teamed together


VÅNTEC-2000 Detector and IµS Microfocus Sealed Tube X-ray Source

 


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Reflection geometry

We have tested our IµS beam delivery system on Bruker D8 diffractometers equipped with area detectors in various configurations. A typical reflection setup is shown in the photo below.

IµS with VÅNTEC-2000 area detector in a D8 diffractometer in reflection geometry

The measurements shown below were obtained using corundum powder as a sample, with a detector distance of 15 cm. In the left measurement, a fine focus sealed tube (45kV, 40mA), a single Göbel mirror, and a 0.3 mm pinhole were used on the primary beam side. The total count rate was 780 cps. The right measurement was recorded with the IµS (45 kV, 0.65 mA), a hybride Montel ("Quazar") multilayer optic, and the same 0.3 mm pinhole. The total count rate of the latter measurement was 12350 cps, 16 times more intensity compared to the standard setup at 60 times lower power!

The measurement below was taken with the same equipment. The sample in this case was quartz powder. The integration of the area detector pattern shown below reveals that the "five fingers" of quartz are well resolved. This is a quite exceptional result for a diffraction measurement taken with an area detector. The resolution so obtained is comparable to the resolution of a Bragg Brentano setup.