In combination with the latest developments of high-brilliant microfocus sealed tubes, the technology to deposit very thin multilayers opens the path to new high-performance low-power X-ray sources for shorter wavelengths, such as our IµS for Mo-Kα radiation.
Experiments for routine structure determination show that IµS for Mo-Kα radiation delivers 1.5 times the flux density of a 5 kW rotating anode plus graphite monochromator ? at only 30 W. The FWHM of the beam from IµS in the image spot is about 120 µm. IµS gives a three-fold intensity gain for very small crystals (edge length ≤ 0.1 mm). For medium sized crystals (edge length 0.1 ? 0.2 mm), the measured intensity is comparable to that of a rotating anode generator with a graphite monochromator.
IµS represents a very attractive low-maintenance and energy-saving alternative
to rotating anode systems.
| Szenicsite |
| crystal size [µm³] | 80x40x2 |
| diffraction limit (Å) | 0.47 |
| exposure time | 20 - 60 s/image |
| mean I/σ | 37.7 (31.1) |
| redundancy | 26.9 (11.4)* |
| completeness[%] | 100 (100) |
| R (int); R (σ) | 0.0576; 0.0173 |
| R (p.i.m.) | 0.0113 |
| R1; wR2 (all) | 0.0261 (0.0596) |
| R1; wR2 (F2>2σ(F2)) | 0.0207 (0.0564) |
Some statistical quantities and a structure plot of szenicsite (Cu3(MoO4)(OH)4; a = 8.4725(3) Å; b = 12.5304(4) Å; c = 6.0621(2) Å; Pnnm; Z = 4; T = 100 K) recorded with a Bruker AXS APEX II QUAZAR diffractometer equipped with IµS-SCD-Mo (* values for outer resolution shell 0.92 ? 0.83 Å).
