X-ray Fluorescence Spectrometry

Light elements analytics with Multilayer Analyzer Crystals

Wavelength dispersive X-ray fluorescence spectrometers (WDXRF) use the diffraction effects (Bragg's law) of an analyzer crystal to separate the different wavelengths of the fluorescence radiation emitted by the sample. For analyzing short wavelengths (Al — U) natural crystals, like LiF 200 or PET are used. However, these inorganic and organic crystals are not suitable for separating long wavelengths (Be — Mg).

Synthetic multilayer crystals based on thin film structures are used for analyzing long wavelengths (Be — S) with an improved light element performance due to higher sensitivity and resolution. The new XS-analyzer crystal series was developed in a partnership between BRUKER AXS and INCOATEC to further optimize the light element performance in WDXRF. The new XS-series results in an unrivalled analytical performance of light elements Be, B, C, N, O, F, Na, Mg, Al, Si, P and S.

The new XS-B analyzer crystal minimizes the lower limit of detection (LOD) for Beryllium and Boron while maximizing sensitivity and resolution. For example the XS-B crystal improves the LOD of Boron by 30% and doubles its intensity compared to conventional analyzer crystals. This maximized analytical performance is beneficial for various industrial applications, where Boron is a key element, such as in the glass industry, BPSG-wafer production, and certain industrial minerals like Colemanite.

 

Comparison of XRF measurements for boron using our XS-B (red) and a former analyzer crystal (blue).

The new XS-C crystal was developed to analyze Carbon in various sample types reducing the background signal by 30%. The improved lower detection limit (LOD) allows the tightest process and quality control by XRF. Typical industrial applications such as the determination of Carbon in steel or in geological samples benefit from the progress made with XS-C.

For implementation in the element range N — Mg the intensity of the analyzer crystals XS-N and XS-55 has been optimized to improve the analytical performance in industrial applications, for example when measuring N in fertilizers or Na and Mg in cement applications (raw mix, clinker, cement)

The new XS-CEM crystal was developed for analyzing cement, glass and industry minerals, where the high concentration rate of both Si and Al requires a particularly stable measurement signal.

BeBCNOFNeNaMgAlSiPS
XS-B xx
XS-Cx
XS-N x
XS-55 xxxxxxxxx
XS-CEM xxxx

Incoatec products for XRF analyzer crystals.

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