Characterization

The quality of coatings for different applications in many cases needs an extensive or even an accurate characterization. The main characteristics of our X-ray optics, the distribution of film thickness and lateral thickness are regularly determined using X-ray measurements. For this purpose we use modern X-ray diffractometers and spectrometers. The shape of the optics is determined using optical profilometry.

Our extended network enables us to use other sophisticated characterization methods as well for example we have access to methods such as scanning and transmission electron microscopy or scanning probe microscopy. Furthermore some of our products are characterized with high quality X-rays at synchrotron sources.