Multilayer growth
The growth of our thin films is examined in selected cases using transmission electron microscopy (TEM), which is important when developing new multilayers, as insight is gained into the growth properties of the selected material combination. Extremely sharp and smooth interface boundaries are necessary in X-ray optical multilayers to achieve near-to-perfect performance. The long-term stability of the mirrors can be examined using annealing tests combined with TEM analyses. The TEM image (courtesy by Prof. W. Jäger, University Kiel) shows a La-B4C multilayer with amorphous layers where a single layer is 5 nm thick. The smooth interfaces demonstrate an optimal growth.