Publications

IµS for X-ray Diffractometry

X-Ray Diffractometry with Low Power Microfocus Sources - New Possibilities in the Lab
J. Wiesmann, J. Graf, C. Hoffmann, A. Hembd, C. Michaelsen, N. Yang, H. Cordes, B. He, U. Preckwinkel, K. Erlacher
Particle & Particle Systems Characterization 26 (3), 2010, 112-116

New microfocus source for x-ray diffractometry in the home-lab
B. Hasse, J. Wiesmann, C. Michaelsen
Proceedings of the SPIE 7448, 2009, 74480Q-Q6

Microfocusing X-ray Equipment for the Lab Diffractometer
J. Wiesmann, J. Graf, C. Hoffmann, C. Michaelsen, A. Oehr, U. Preckwinkel, N. Yang, H. Cordes, K. Erlacher

New Possibilities for X-ray Diffractometry
Jörg Wiesmann, Jürgen Graf, Christian Hoffmann, Carsten Michaelsen

Neue Möglichkeiten im Labor: Röntgendiffraktometrie mit Niedrigleistungs-Mikrofokusquellen
J. Wiesmann, C. Michaelsen, J. Graf, A. Oehr, A. Sabeti, K. Wulf, C. Hoffmann, U. Preckwinkel, N. Yang, B. He, H. Cordes

X-ray Optics and Multilayers

Multilayer optics for femtosecond-diffractometry
J. Wiesmann, F. Hertlein, C. Michaelsen
Proceedings of the SPIE 7448, 2009, 74480M-M6

Nanoscaled Multilayer Coatings for X-Ray Optics
F. Hertlein, S. Kroth, C. Michaelsen, A. Oehr, J. Wiesmann
Advanced Engineering Materials 10 (7), 2008, 686-691

State-of-the-art Thin Film X-ray Optics For Conventional Synchrotrons And FEL Sources
J. Wiesmann, C. Michaelsen, F. Hertlein, M. Störmer and A. Seifert