Nanotechnology sets a precedent
Geesthacht, 11. Oct. 2010: How has Nanotechnology revolutionized X-ray Analytics und how can this knowledge be conveyed to pupils at school? These questions were amongst many that were answered during the further education course "X-ray Analytics and Nanotechnology" which took place at Incoatec GmbH in Geesthacht.
Incoatecs specialist for Manufacturing of Multilayer X-ray Optics, Uwe Heidorn, explains:
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Basics of Diffractometry
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