15.09.2009

Texture measurements on thin films using an X-ray microfocus source

Incoatec´s presentation at the ECM 25

At this year´s European Crystallographic Meeting in Istanbul, our Application Scientist Dr. Bernd Hasse presented recent results from our application lab at the poster session with the title: "Texture measurements on thin films using an X-ray microfocus source".

Texture measurements of thin films of superconducting YBCO on strontium titanate substrates were carried out within a short space of time, using a Bruker D8 GADDS with an integrated IµS. Complete pole figure measurements could be carried out in less than an hour.