The new Incoatec Microfocus Source
... Highest Brilliance ... Intelligent ... Approved Quality and Convenience ...
With its outstanding performance the new Incoatec Microfocus Source IμSHigh Brilliance raises the standard of low-maintenance sealed tube solutions for crystallography. Compared to the classic IμS, the IμSHigh Brilliance shows an increase in intensity of about 30 % for Cu, 50 % for Ag and 60 % for Mo (Fig 1). The IμSHigh Brilliance perfectly matches the new Bruker D8 crystallography solutions (Fig 2).
| || |
|Fig 1 ||Fig 2 |
What´s new? The improved optical design makes it possible to produce more photons in the same small spot. Tried and trusted, our state-of-the-art Quazar multilayer optics are ideal for 2-dim focusing or collimating. Of course, the IμSHigh Brilliance includes all familiar advantages of our previous IμS systems: air-cooling, no moving parts, long lifetime without maintenance (3 years warranty). Furthermore, memory chips are built into tube, tube mount and optics, recording the real-time status of the components ("DAVINCI" design). These data allow for easier installation and change of components, and can be assessed online, making remote diagnostics faster, better and easier. The result is an absolutely reliable system. The IμS fulfills highest safety standards: radiation safe, vacuum tested and fully compliant with Machinery Directive 2006/42/EC.
With a peak flux density of more than 2*109 photons/(s mm2) the Mo-IμSHigh Brilliance enables scientists in small molecule and highresolution crystallography to collect better data sets in shorter time. Measurements in the Incoatec Application Lab with a Bruker D8 show an increase of more than 60 % in the diffracted intensity.
Two data sets (left) with statistics of an Ylid crystal (C11H10O2S, 0.16 x 0.12 x 0.12 mm3, 2s/0.5° exposure time, h0l layer) ) and section of the diffaction pattern (right) of the Ylid crystal recorded with an IμSHigh Brilliance (above) and a classic IμS (below).
The compact design makes the IμSHigh Brilliance an attractive component for many academic and industrial research organizations to upgrade existing X-ray analytical instruments to cutting-edge performance.